Invention Grant
- Patent Title: Quantitative impact control and measurement system
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Application No.: US16199741Application Date: 2018-11-26
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Publication No.: US11054323B2Publication Date: 2021-07-06
- Inventor: Sungwook Yang , Eui-Sung Yoon , Hoon Ryu , Hyeonjoo Im
- Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Applicant Address: KR Seoul
- Assignee: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee Address: KR Seoul
- Agency: Rabin & Berdo P.C.
- Priority: KR10-2018-0013421 20180202
- Main IPC: G01L5/00
- IPC: G01L5/00 ; A61B5/00 ; A61B5/103

Abstract:
A quantitative impact control and measurement system includes an impactor configured to apply an impact to a target, a control device configured to control movement of the impactor, an acceleration sensor mounted to a base of the impactor, and an impact sensor mounted to a terminal of the impactor. Here, the control device calculates an impact actually applied to the target from signals measured through the acceleration sensor and the impact sensor.
Public/Granted literature
- US20190242766A1 QUANTITATIVE IMPACT CONTROL AND MEASUREMENT SYSTEM Public/Granted day:2019-08-08
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