Invention Grant
- Patent Title: Monitoring DOE performance using software scene evaluation
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Application No.: US14742816Application Date: 2015-06-18
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Publication No.: US11054664B2Publication Date: 2021-07-06
- Inventor: Alon Yasovsky , Ronen Deitch , Yohai Zmora
- Applicant: APPLE INC.
- Applicant Address: US CA Cupertino
- Assignee: APPLE INC.
- Current Assignee: APPLE INC.
- Current Assignee Address: US CA Cupertino
- Agency: Kligler & Associates Patent Attorneys Ltd
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G02B27/42 ; G06K9/00

Abstract:
A method for projection includes projecting a pattern of structured light with a given average intensity onto a scene. A sequence of images is captured of the scene while projecting the pattern. At least one captured image in the sequence is processed in order to extract a depth map of the scene. A condition is identified in the depth map indicative of a fault in projection of the pattern. Responsively to the identified condition, the average intensity of the projection of the pattern is reduced.
Public/Granted literature
- US20160371845A1 MONITORING DOE PERFORMANCE USING SOFTWARE SCENE EVALUATION Public/Granted day:2016-12-22
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