- 专利标题: Electronics card insitu testing apparatus and method utilizing unintended RF emission features
-
申请号: US15963325申请日: 2018-04-26
-
公开(公告)号: US11069952B2公开(公告)日: 2021-07-20
- 发明人: Walter J. Keller, III
- 申请人: NOKOMIS, INC.
- 申请人地址: US PA Charleroi
- 专利权人: NOKOMIS, INC.
- 当前专利权人: NOKOMIS, INC.
- 当前专利权人地址: US PA Charleroi
- 代理机构: AP Patents
- 代理商 Alexander Pokot
- 主分类号: H01Q1/22
- IPC分类号: H01Q1/22 ; H01Q1/24 ; H01Q3/02 ; H01Q1/38 ; G01R31/00
摘要:
A diagnostic apparatus for analysis, testing, inspecting and/or screening an integrated and assembled electrically powered equipment rack and its populated cards and devices for measurement of degree of device aging, improper operation, degradation, condition, and/or Remaining Useful Life (RUL). The device includes an antenna card with a detachably attachable antenna module that can be positioned at a distance from the electrically devices under test and a signal receiver or sensor for examining a signal from the electrically powered device, but especially applied to rackmount supported electronics and/or chassis based electronics. The receiver or sensor collects unintended and/or intended RF energy components emitted by the electrically powered device and performs the above analysis in a response to the acquired signal input while the electrically powered device is active or powered.