- 专利标题: Progressive photon mapping method employing statistical model test
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申请号: US17041650申请日: 2018-03-30
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公开(公告)号: US11094111B2公开(公告)日: 2021-08-17
- 发明人: Sheng Li , Zehui Lin , Xinlu Zeng , Guoping Wang
- 申请人: Peking University
- 申请人地址: CN Beijing
- 专利权人: Peking University
- 当前专利权人: Peking University
- 当前专利权人地址: CN Beijing
- 代理机构: SV Patent Service
- 优先权: CN201810257307.8 20180327
- 国际申请: PCT/CN2018/081415 WO 20180330
- 国际公布: WO2019/183949 WO 20191003
- 主分类号: G06T15/50
- IPC分类号: G06T15/50 ; G06T15/06
摘要:
A progressive photon mapping method based on statistical test includes launching rays from the viewpoint to each pixel on the image plane and intersecting the three-dimensional scene to be rendered. If an intersection with diffuse surface is found on the tracing path, it is recorded as the hit point; a photon pass is performed: 31) performing photon tracing step; 32) performing photon collection processing for each hit point; 33) if the current iteration of photon pass does not need chi-square test, then performing flux accumulation and keeping the collection radius unchanged; if chi-square is required, evaluating the photon distribution quality; computing a collection radius according to the estimated photon distribution, and performing the flux accumulation in the current photon pass; 34) if the photon collection radius is reduced, then performing distributed ray tracing, generating new hit points, and go to 31), otherwise go to 31), start a new iteration of photon pass.
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IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/50 | .发光效果 |