Invention Grant
- Patent Title: Distance sensor, and calibration method performed by device and system including the distance sensor
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Application No.: US16715505Application Date: 2019-12-16
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Publication No.: US11099262B2Publication Date: 2021-08-24
- Inventor: A-ron Baik , Jung-gap Kuk , Chang-soo Park , Seung-beom Han , Mid-eum Choi , Jung-un Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2017-0016851 20170207
- Main IPC: G01C3/08
- IPC: G01C3/08 ; G01S7/497 ; G01S7/481 ; G01S17/931 ; G01S17/42
Abstract:
A calibration method performed by a distance sensor emitting at least one beam is provided. The calibration method includes obtaining information regarding one surface of an object; obtaining distance sensor data by emitting a plurality of beams to the one surface of the object; and performing calibration on the plurality of beams emitted by the distance sensor, based on the information about the one surface of the object and the distance sensor data.
Information query
