发明授权
- 专利标题: Dynamic monitoring and securing of factory processes, equipment and automated systems
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申请号: US16904984申请日: 2020-06-18
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公开(公告)号: US11100221B2公开(公告)日: 2021-08-24
- 发明人: Matthew C. Putman , John B. Putman , Vadim Pinskiy , Damas Limoge , Andrew Sundstrom , James Williams, III
- 申请人: Nanotronics Imaging, Inc.
- 申请人地址: US OH Cuyahoga Falls
- 专利权人: Nanotronics Imaging, Inc.
- 当前专利权人: Nanotronics Imaging, Inc.
- 当前专利权人地址: US OH Cuyahoga Falls
- 代理机构: DLA Piper LLP (US)
- 主分类号: G05B23/02
- IPC分类号: G05B23/02 ; G06F21/55 ; G06F21/56 ; G06N3/063 ; G05B19/4155 ; G06N3/08
摘要:
A system including a deep learning processor receives one or more control signals from one or more of a factory's process, equipment and control (P/E/C) systems during a manufacturing process. The processor generates expected response data and expected behavioral pattern data for the control signals. The processor receives production response data from the one or more of the factory's P/E/C systems and generates production behavioral pattern data for the production response data. The process compares at least one of: the production response data to the expected response data, and the production behavioral pattern data to the expected behavioral pattern data to detect anomalous activity. As a result of detecting anomalous activity, the processor performs one or more operations to provide notice or cause one or more of the factory's P/E/C systems to address the anomalous activity.
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