Invention Grant
- Patent Title: Log analysis device, log analysis method, and recording medium storing program
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Application No.: US16089196Application Date: 2017-03-21
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Publication No.: US11106563B2Publication Date: 2021-08-31
- Inventor: Yasuhiro Ajiro , Zong Bo , Xu Jianwu
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JPJP2016-067122 20160330
- International Application: PCT/JP2017/011102 WO 20170321
- International Announcement: WO2017/169949 WO 20171005
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/34

Abstract:
A log analysis device includes a correlation model generation unit that generates a correlation model between a pattern of a log output from a monitored target in a prescribed period and the monitored target, based on time series of the pattern and an operating status of the monitored target, and a determination unit that determines existence of an abnormality in the monitored target based on the correlation model.
Public/Granted literature
- US20200301810A1 LOG ANALYSIS DEVICE, LOG ANALYSIS METHOD, AND RECORDING MEDIUM STORING PROGRAM Public/Granted day:2020-09-24
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