Invention Grant
- Patent Title: Ophthalmic measurement device
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Application No.: US16478191Application Date: 2018-01-24
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Publication No.: US11109754B2Publication Date: 2021-09-07
- Inventor: Toshifumi Mihashi
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chiesa Shahinian & Giantomasi PC
- Priority: JPJP2017-011131 20170125
- International Application: PCT/JP2018/002102 WO 20180124
- International Announcement: WO2018/139481 WO 20180802
- Main IPC: A61B3/103
- IPC: A61B3/103 ; A61B3/00 ; A61B3/14

Abstract:
Provided is an ophthalmic measurement device with which it is possible to obtain an area in which a measurement can be taken without moving an optical system. With reference to an optical path length of an illumination optical system with which light is focused on the eyeground when the refraction value is 0 D, the positions of two light sources are set to achieve a setting in which the optical path length becomes slightly shorter. By doing so, it is possible to cope with measurement of refractive properties in a large area without employing structures that allow a lens system of the illumination optical system and the light sources thereof to be moved. In addition, by selecting one of the two light sources so that a clearer Hartmann image can be obtained, it is possible to further increase the precision of the refractive properties to be measured.
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