Invention Grant
- Patent Title: Apparatus and method for measuring particulate matter
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Application No.: US16819618Application Date: 2020-03-16
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Publication No.: US11112363B2Publication Date: 2021-09-07
- Inventor: Woo Chang Lee , Yun S Park , Ho Jun Chang , Sung Hyun Nam
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2019-0094822 20190805
- Main IPC: G01N21/65
- IPC: G01N21/65 ; G01N21/03 ; G01J3/44 ; G01N15/02 ; G01N15/00 ; G01N15/06

Abstract:
Provided is an apparatus for measuring particulate matter including an image obtaining device configured to charge particulate matter particles included in air that is introduced to the image obtaining device, and to obtain an image of the charged particulate matter particles based on lens-free imaging, a spectrum obtaining device configured to obtain a Raman spectrum of the charged particulate matter particles, and a processor configured to determine a size of the particulate matter particles and a concentration of the particulate matter particles based on the obtained image, and to determine components of the particulate matter particles based on the obtained Raman spectrum.
Public/Granted literature
- US20210041365A1 APPARATUS AND METHOD FOR MEASURING PARTICULATE MATTER Public/Granted day:2021-02-11
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