Invention Grant
- Patent Title: Real time block failure analysis for a memory sub-system
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Application No.: US16035320Application Date: 2018-07-13
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Publication No.: US11113129B2Publication Date: 2021-09-07
- Inventor: Francis Chew , Gerald L. Cadloni , Bruce A. Liikanen
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G11C29/44

Abstract:
Several embodiments of memory devices and systems for real time block failure analysis are disclosed herein. In one embodiment, a system includes a memory array including a plurality of memory cells and a processing device coupled to the memory array. The processing device is configured to sense, in response to detection of an error associated with a subset of a plurality of memory cells of the memory device, a state associated with each memory cell of the subset of the plurality of memory cells. The processing device is further configured to store state distribution information in a persistent memory, the state distribution information comprising the sensed state associated with each memory cell of the subset.
Public/Granted literature
- US20200019453A1 REAL TIME BLOCK FAILURE ANALYSIS FOR A MEMORY SUB-SYSTEM Public/Granted day:2020-01-16
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