Invention Grant
- Patent Title: Intra-cluster node troubleshooting method and device
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Application No.: US16732749Application Date: 2020-01-02
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Publication No.: US11115263B2Publication Date: 2021-09-07
- Inventor: Yan Zeng , Fan Yu , Yinwen Wang , Yutao Shuai , Xiaoming Yue
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Guangdong
- Priority: CN201710564995.8 20170712
- Main IPC: H04L12/24
- IPC: H04L12/24 ; H04L12/26

Abstract:
Embodiments of this application relate to an intra-cluster node troubleshooting method and device. The method includes: obtaining fault detection topology information of a cluster, where the fault detection topology information includes a fault detection relationship between all nodes in the cluster; obtaining a fault indication message, where the fault indication message is used to indicate unreachability from a detection node to a detected node; determining a sub-cluster of the cluster based on the fault detection topology information and the fault indication message, where nodes that belong to different sub-clusters are unreachable to each other; and determining a working cluster based on the sub-cluster of the cluster. According to the embodiments of this application, available nodes in the cluster can be retained to a maximum extent at relatively low costs. In this way, a quantity of available nodes in the cluster is increased, high availability is ensured.
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