Invention Grant
- Patent Title: Method and apparatus for measuring rigidity distribution
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Application No.: US16061537Application Date: 2016-12-16
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Publication No.: US11118892B2Publication Date: 2021-09-14
- Inventor: Alexis Lussier Desbiens , Camille Brousseau , Jonas Truong
- Applicant: SOCPRA SCIENCES ET GENIE S.E.C.
- Applicant Address: CA Sherbrooke
- Assignee: SOCPRA SCIENCES ET GENIE S.E.C.
- Current Assignee: SOCPRA SCIENCES ET GENIE S.E.C.
- Current Assignee Address: CA Sherbrooke
- Agency: Norton Rose Fulbright Canada LLP
- International Application: PCT/CA2016/051498 WO 20161216
- International Announcement: WO2017/100940 WO 20170622
- Main IPC: G01B5/30
- IPC: G01B5/30 ; G01N3/20 ; G01N3/22 ; G01B5/00 ; G01N3/08

Abstract:
An apparatus for measuring a deformation distribution of an object having a longitudinal dimension comprises a structure for supporting the object. A sensor unit comprises a base, a contact member having a body connected to the base by a rotational joint such rotational degrees of freedom are provided between the base and the contact member, an end of the body configured to contact and move along the object, and at least one sensor for determining an orientation of the body relative to the base. A displacement module enables relative movement between the sensor unit and the structure for the sensor unit to relatively move along the object in the longitudinal dimension. A method and system for measuring a rigidity distribution of an object having a longitudinal dimension are also provided.
Public/Granted literature
- US20200263970A1 METHOD AND APPARATUS FOR MEASURING RIGIDITY DISTRIBUTION Public/Granted day:2020-08-20
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