Invention Grant
- Patent Title: Optical intensity method to measure the thickness of coatings deposited on substrates
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Application No.: US16998219Application Date: 2020-08-20
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Publication No.: US11125549B2Publication Date: 2021-09-21
- Inventor: Gunter E. Moeller , Roman Y. Korotkov , Ryan C. Smith
- Applicant: Arkema Inc.
- Applicant Address: US PA King of Prussia
- Assignee: Arkema Inc.
- Current Assignee: Arkema Inc.
- Current Assignee Address: US PA King of Prussia
- Agent Lynn B. Morreale
- Main IPC: G01B11/06
- IPC: G01B11/06 ; B05B12/08 ; B05D1/02

Abstract:
Methods and apparatus for measuring a thickness of a coating on an moving object are provided. Light is directed toward the object at a predetermined location on the object such that a portion of the light interacts with the object. A 1D and/or 2D maximum intensities for at least one wavelength channel is captured that is produced by the portion of the light interacting with the object. A measured average intensity of the wavelength channel and/or intensities and their arithmetic derivatives of multi wavelength channel geometries is converted into 1D (averaged) and/or 2D thickness values. Based on these values an acceptability of the coating is evaluated and thickness calculated.
Public/Granted literature
- US20210025693A1 OPTICAL INTENSITY METHOD TO MEASURE THE THICKNESS OF COATINGS DEPOSITED ON SUBSTRATES Public/Granted day:2021-01-28
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