A test system can use first and different second driver stages to provide test signals to a device under test (DUT). A compound stage can receive signals from the driver stages and provide a voltage output signal to the DUT, such as via a gain circuit. The compound stage can include a buffer circuit configured to provide a first portion of the voltage output signal based on a first output signal from the first driver stage, and the compound stage can include a transimpedance circuit configured to provide a second portion of the voltage output signal based on a second output signal from the second driver stage. In an example, the gain circuit can receive a superposition signal comprising the first and second portions of the voltage output signal and, in response, provide a test signal to the DUT.