- Patent Title: Extended-drain field-effect transistors including a floating gate
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Application No.: US16568591Application Date: 2019-09-12
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Publication No.: US11127860B2Publication Date: 2021-09-21
- Inventor: Ming-Cheng Chang , Nigel Chan
- Applicant: GLOBALFOUNDRIES U.S. Inc.
- Applicant Address: US CA Santa Clara
- Assignee: GLOBALFOUNDRIES U.S. Inc.
- Current Assignee: GLOBALFOUNDRIES U.S. Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Thompson Hine LLP
- Agent Francois Pagette
- Main IPC: H01L29/788
- IPC: H01L29/788 ; H01L29/08 ; H01L23/528 ; H01L29/45 ; H01L29/66 ; H01L21/02 ; H01L29/78 ; H01L21/266 ; H01L21/265 ; H01L29/36 ; H01L29/49 ; H01L21/28

Abstract:
Structures for an extended-drain field-effect transistor and methods of forming an extended-drain field-effect transistor. A source region is coupled to a semiconductor layer, a drain region is coupled to the semiconductor layer, and a first gate structure is positioned over a channel region of the semiconductor layer. An extended drain region is positioned between the channel region and the drain region. The extended drain region includes a portion of the semiconductor layer between the first gate structure and the drain region. A second gate structure is arranged over the portion of the semiconductor layer.
Public/Granted literature
- US20210083095A1 EXTENDED-DRAIN FIELD-EFFECT TRANSISTORS INCLUDING A FLOATING GATE Public/Granted day:2021-03-18
Information query
IPC分类: