Invention Grant
- Patent Title: Measuring system and method for measuring an implant-implant situation
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Application No.: US16317667Application Date: 2017-07-21
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Publication No.: US11129697B2Publication Date: 2021-09-28
- Inventor: Joachim Pfeiffer , Frank Thiel
- Applicant: DENTSPLY SIRONA inc.
- Applicant Address: US PA York
- Assignee: DENTSPLY SIRONA inc.
- Current Assignee: DENTSPLY SIRONA inc.
- Current Assignee Address: US PA York
- Agency: Dentsply Sirona Inc.
- Priority: DE102016213399.3 20160721
- International Application: PCT/EP2017/068541 WO 20170721
- International Announcement: WO2018/015562 WO 20180125
- Main IPC: A61C9/00
- IPC: A61C9/00 ; A61C19/04 ; A61C8/00
Abstract:
The invention relates to a measuring system for measuring an implant-implant situation for planning an implant-supported tooth replacement part supported on at least two implants, comprising a scanning template and the at least two set implants. The scanning template has cut-outs for the individual implants, wherein first markings are arranged on surface regions around the cut-outs.
Public/Granted literature
- US20190282343A1 MEASURING SYSTEM AND METHOD FOR MEASURING AN IMPLANT-IMPLANT SITUATION Public/Granted day:2019-09-19
Information query
