Provided are correction pattern obtaining apparatuses and methods of obtaining a correction pattern by using the correction pattern obtaining apparatuses. The correction pattern obtaining apparatus includes a flat panel display having an optical element that receives one or more input test patterns, a detector that measures intensity of light emitted from the flat panel display corresponding to each of the one or more input test patterns and a processor that determines a correction pattern comprising one or more of the one or more test patterns at a given ratio based on the measured intensity of light corresponding to each of the one or more input test patterns.