Invention Grant
- Patent Title: Aligner image based quality control system
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Application No.: US16851038Application Date: 2020-04-16
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Publication No.: US11138727B2Publication Date: 2021-10-05
- Inventor: Anatoliy Parpara , Ivan Kharpalev , Stephan Albert Alexandre Dumothier , Andrey Cherkas , Alexey Kalinichenko , Jack Shaw , Israel Velazquez
- Applicant: Align Technology, Inc.
- Applicant Address: US CA San Jose
- Assignee: Align Technology, Inc.
- Current Assignee: Align Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Lowenstein Sandler LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; A61C7/00 ; A61C13/00 ; G01N21/956 ; G06T7/521 ; G06T17/10

Abstract:
A system for inspecting a customized dental device associated with a dental application for manufacturing defects is disclosed. The system obtains images of the customized device and identifies an identifier of the customized device. The system determines a digital file associated with the customized device based on the identifier, the digital file including a first digital model of the customized device and/or a second digital model of a mold used during manufacture of the customized device. The system determines an intended property for the customized device based on at least one of the first digital model or the second digital model, determines an actual property of the customized device from the images, determines whether there is a manufacturing defect in the customized device by comparing the intended property for the customized device with the actual property of the customized device, and outputs an output associated with the determination.
Public/Granted literature
- US20200242765A1 ALIGNER IMAGE BASED QUALITY CONTROL SYSTEM Public/Granted day:2020-07-30
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