Certain aspects of the present disclosure provide methods and apparatus for testing a one-time programmable (OTP) memory device, including the functionality of a sense amplifier circuit. The OTP memory device includes a memory array, an input latch circuit, and a sense amplifier circuit comprising a current source and a multiplexer. The multiplexer has a first input coupled to an output of the memory array, a second input coupled to the input latch circuit, and an output coupled to an input of the current source circuit.