- 专利标题: Automated implant movement analysis systems and related methods
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申请号: US16752799申请日: 2020-01-27
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公开(公告)号: US11158062B2公开(公告)日: 2021-10-26
- 发明人: Olof Sandberg , Claes Lundström
- 申请人: Sectra AB
- 申请人地址: SE Linköping
- 专利权人: Sectra AB
- 当前专利权人: Sectra AB
- 当前专利权人地址: SE Linköping
- 代理机构: Myers Bigel, P.A.
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T7/215 ; G16H30/20 ; G16H20/40 ; G06T7/00 ; G06T7/11 ; G06T7/30 ; G06K9/62 ; G06T7/174 ; A61B34/10 ; G06T7/38
摘要:
Methods, systems, workstations, and computer program products that provide automated implant analysis of batches of image data sets of a plurality of different patients having an implant coupled to bone using a first data set of a first patient from the batch of image data sets, the first data set comprising a first image stack and a second image stack and allowing a user to select parameter settings for implant movement analysis of the implant including selecting a first object of interest and a second reference object. Measurements of movement of the implant and/or coupled bone can be automatically calculated and selected parameter settings can be automatically propagated to other image data sets of other patients of the batch of image data sets and measurements for the batch of image data sets of others of the different patients can be automatically calculated.
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