- 专利标题: Sample inspection method and system
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申请号: US16968396申请日: 2019-02-13
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公开(公告)号: US11189456B2公开(公告)日: 2021-11-30
- 发明人: Paul Van Schayck , Raimond Ravelli
- 申请人: Universiteit Maastricht
- 申请人地址: NL Maastricht
- 专利权人: Universiteit Maastricht
- 当前专利权人: Universiteit Maastricht
- 当前专利权人地址: NL Maastricht
- 代理机构: Karceski IP Law, PLLC
- 优先权: EP18156577 20180213
- 国际申请: PCT/EP2019/053606 WO 20190213
- 国际公布: WO2019/158617 WO 20190822
- 主分类号: H01J37/24
- IPC分类号: H01J37/24 ; G01T1/29 ; H01J37/244
摘要:
A sample may be inspected by making particles traverse the sample. The particles that have traversed the sample hit a detector one-by-one. In response thereto, the detector provides a sequence of respective detection outputs. The sequence of respective detection outputs is processed so as to identify respective locations where respective incident particles have hit the detector. An image is generated on the basis of the respective locations that have been identified. In order to determine a location where an incident particle has hit the detector, an evaluation is made with regard to pre-established respective associations between, on the one hand, respective locations where incident particles have hit the detector and, on the other hand, respective detection outputs.
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