Invention Grant
- Patent Title: Surface property measuring method and surface property measuring device
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Application No.: US16655811Application Date: 2019-10-17
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Publication No.: US11193749B2Publication Date: 2021-12-07
- Inventor: Tatsuki Nakayama
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2018-204760 20181031
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01B5/20

Abstract:
The present disclosure uses a surface property measuring device that includes an arm swingably supported so as to displace a stylus vertically, and an arm lifter that holds the stylus at a predetermined height by rotating the arm. After arranging the arm lifter in a state where the arm can be held at a lower limit height that is only a predetermined drop amount below a predetermined measurement height, the arm is arranged at the measurement height and the stylus contacts a measured object, and in this state surface properties of the measured object are measured.
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