Invention Grant
- Patent Title: Geometry measurements in x-ray image
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Application No.: US16614075Application Date: 2018-05-14
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Publication No.: US11213269B2Publication Date: 2022-01-04
- Inventor: Hanns-Ingo Maack , Bernd Menser , Detlef Mentrup
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Agent Larry Liberchuk
- Priority: EP17171878 20170519
- International Application: PCT/EP2018/062421 WO 20180514
- International Announcement: WO2018/210773 WO 20181122
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
The present invention relates to processing X-ray images of an object. In order to improve the accuracy for interactive geometrical measurements, a device (10) for processing of an X-ray image of an object (30) is provided. The device comprises an input unit (12) and a processing unit (14). The input unit is configured to provide a shape related information (16) from an object (30) to be irradiated. The input unit is also configured to provide a generic object model (20), and to provide an actual X-ray image (18) of the object. The processing unit is configured to adapt the generic object model based on the shape related information in order to generate an individual object model (22). The processing unit is also configured to determine, based on the individual object model, an individual image processing modificator (24) for processing at least one part of the X-ray image, and to apply the individual image processing modificator for further processing of the X-ray image.
Public/Granted literature
- US20210153833A1 IMPROVED GEOMETRY MEASUREMENTS IN X-RAY IMAGE Public/Granted day:2021-05-27
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