- 专利标题: Terahertz spectrum test device and system
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申请号: US16727093申请日: 2019-12-26
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公开(公告)号: US11215555B2公开(公告)日: 2022-01-04
- 发明人: Cui Guo , Yi Pan , Zhanqiang Xue
- 申请人: Shenzhen Institute of Terahertz Technology and Innovation Co., Ltd. , Shenzhen Institute of Terahertz Technology and Innovation
- 申请人地址: CN Guangdong; CN Guangdong
- 专利权人: Shenzhen Institute of Terahertz Technology and Innovation Co., Ltd.,Shenzhen Institute of Terahertz Technology and Innovation
- 当前专利权人: Shenzhen Institute of Terahertz Technology and Innovation Co., Ltd.,Shenzhen Institute of Terahertz Technology and Innovation
- 当前专利权人地址: CN Guangdong; CN Guangdong
- 代理机构: Panitch Schwarze Belisario & Nadel LLP
- 优先权: CN201811601929.4 20181226
- 主分类号: G01N21/3586
- IPC分类号: G01N21/3586 ; G01N21/39
摘要:
A terahertz spectrum test device and system includes a femtosecond fiber laser configured to generate a pump light and a probe light. The pump light excites a terahertz transmitter to generate terahertz waves which are transmitted to a sample suspension device to irradiate a suspended to-be-tested sample, and the probe light is directly transmitted to a terahertz detector. The terahertz detector receives the terahertz waves transmitted from the sample suspension device, and then transmits the terahertz waves and the probe light together to a signal processing circuit to obtain a corresponding terahertz time-domain spectrum. By adoption of the terahertz spectrum test device and system, the to-be-tested sample need not be fixed with a clamp or other instruments, so that terahertz waves will not irradiate to the instrument used for fixing the to-be-tested sample during a terahertz spectrum test, which may otherwise affect the test result.
公开/授权文献
- US20200209154A1 TERAHERTZ SPECTRUM TEST DEVICE AND SYSTEM 公开/授权日:2020-07-02
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