Invention Grant
- Patent Title: Measuring X-ray CT apparatus and tomographic image generating method
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Application No.: US16291674Application Date: 2019-03-04
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Publication No.: US11234670B2Publication Date: 2022-02-01
- Inventor: Sadayuki Matsumiya , Hidemitsu Asano , Masato Kon
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2018-044643 20180312
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A61B6/00 ; G01N23/046 ; G06T11/00 ; A61B6/03

Abstract:
When generating a tomographic image using a measuring X-ray CT apparatus that is configured to emit X-rays while rotating a specimen that is arranged on a rotary table and reconstruct a projection image thereof to generate a tomographic image of the specimen, an amount of geometric error that is included in the projection image is obtained in advance and stored; the projection image is corrected using the stored amount of geometric error; and a tomographic image is reconstructed using the corrected projection image.
Public/Granted literature
- US20190274654A1 MEASURING X-RAY CT APPARATUS AND TOMOGRAPHIC IMAGE GENERATING METHOD Public/Granted day:2019-09-12
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