Invention Grant
- Patent Title: Method and system for detecting anomalies in data labels
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Application No.: US15858001Application Date: 2017-12-29
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Publication No.: US11238365B2Publication Date: 2022-02-01
- Inventor: Francis Hsu , Mridul Jain , Saurabh Tewari
- Applicant: Oath Inc.
- Applicant Address: US NY New York
- Assignee: Oath Inc.
- Current Assignee: Oath Inc.
- Current Assignee Address: US NY New York
- Agency: Venable LLP
- Main IPC: G06N20/00
- IPC: G06N20/00 ; G06N5/02 ; G06F16/28

Abstract:
The present teaching relates to a method and system for validating labels of training data. A first group of data records associated with the training data are received, wherein each of the first group of data records includes a vector having at least one feature and a first label. For each of the first group of data records, a second label is determined based on the at least one feature in accordance with a first model. Thereafter, a loss based on the first label associated with the data record and the second label is obtained, and the data record having an incorrect first label is classified when the loss meets a pre-determined criterion. Upon classifying the data records, a sub-group of the first group of data records is generated, wherein each of the data records included in the sub-group has the incorrect first label.
Public/Granted literature
- US20190205794A1 METHOD AND SYSTEM FOR DETECTING ANOMALIES IN DATA LABELS Public/Granted day:2019-07-04
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