Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US16481918Application Date: 2017-02-13
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Publication No.: US11239051B2Publication Date: 2022-02-01
- Inventor: Mai Yoshihara , Yuusuke Oominami
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- International Application: PCT/JP2017/005032 WO 20170213
- International Announcement: WO2018/146804 WO 20180816
- Main IPC: H01J37/22
- IPC: H01J37/22 ; H01J37/28 ; H01J37/20 ; H01J37/26 ; H01J37/10

Abstract:
An object of the invention is to provide a device for observing the same field of view with a charged particle beam device and a camera without increasing a size of a housing. A charged particle beam device according to an aspect of the invention includes: a lens barrel that irradiates a sample with a charged particle beam; an imaging unit that images an optical image of the sample; a sample table on which the sample is placed; and a stage that is movable and on which the sample table is placed, wherein when a distance between a physical central axis of the sample table and a physical optical axis of the imaging unit is defined as a first distance, and a distance between a virtual central axis of the sample table and a physical central axis of the imaging unit, or between the physical central axis of the sample table and a virtual central axis of the imaging unit, or between the virtual central axis of the sample table and the virtual central axis of the imaging unit is defined as a second distance, the second distance is shorter than the first distance.
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