Invention Grant
- Patent Title: Method and apparatus for analyzing a collision in an electronic device
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Application No.: US16110769Application Date: 2018-08-23
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Publication No.: US11243129B2Publication Date: 2022-02-08
- Inventor: Jaeyoung Shin , Jungsik Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: The Farrell Law Firm, P.C.
- Priority: KR10-2017-0109685 20170829
- Main IPC: G01L5/00
- IPC: G01L5/00 ; H04W4/38 ; H04M1/72454

Abstract:
An electronic device includes at least one sensor configured to collect sensing data, a memory configured to store the sensing data, and a processor. The processor is configured to acquire first sensing data through the at least one sensor and determine a falling pattern of the electronic device based on the first sensing data, acquire second sensing data through the at least one sensor and determine a collision pattern according to falling of the electronic device based on the second sensing data, determine the type of object with which the electronic device collides based on the falling pattern and the collision pattern, and perform a preset function based on the type of the object.
Public/Granted literature
- US20190064017A1 METHOD AND APPARATUS FOR ANALYZING A COLLISION IN AN ELECTRONIC DEVICE Public/Granted day:2019-02-28
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