Invention Grant
- Patent Title: Abnormality detection device and abnormality detection method
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Application No.: US16298698Application Date: 2019-03-11
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Publication No.: US11250268B2Publication Date: 2022-02-15
- Inventor: Hiroo Ikeda
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2014-132304 20140627
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G08B25/00 ; H04N7/18 ; G08B13/196 ; H04N5/232
Abstract:
An image processing device (100) includes a change detection unit (101) that detects a target state change in a person on the basis of an input image, and a determination unit (102) that determines an abnormal state in accordance with a detection obtained by detecting occurrences of the target state change in a plurality of persons.
Public/Granted literature
- US20190205657A1 ABNORMALITY DETECTION DEVICE AND ABNORMALITY DETECTION METHOD Public/Granted day:2019-07-04
Information query
