- 专利标题: Semiconductor module and method for manufacturing same
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申请号: US16616473申请日: 2018-03-13
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公开(公告)号: US11251134B2公开(公告)日: 2022-02-15
- 发明人: Hiroyoshi Higashisaka
- 申请人: SHARP KABUSHIKI KAISHA
- 申请人地址: JP Sakai
- 专利权人: SHARP KABUSHIKI KAISHA
- 当前专利权人: SHARP KABUSHIKI KAISHA
- 当前专利权人地址: JP Sakai
- 代理机构: ScienBiziP, P.C.
- 优先权: JPJP2017-104763 20170526
- 国际申请: PCT/JP2018/009646 WO 20180313
- 国际公布: WO2018/216318 WO 20181129
- 主分类号: H01L23/544
- IPC分类号: H01L23/544 ; H01L33/00 ; H01L25/075 ; H01L33/62
摘要:
A semiconductor module includes a base material, an alignment mark provided on a surface of the base material and plural semiconductor elements that are individually provided on the surface of the base material while being juxtaposed to the alignment mark and that are separated from each other. Accordingly, a semiconductor module and a method for manufacturing the semiconductor module are provided which may prevent an alignment mark from being peeled off and remaining as a foreign object and may improve reliability.
公开/授权文献
- US20200185333A1 SEMICONDUCTOR MODULE AND METHOD FOR MANUFACTURING SAME 公开/授权日:2020-06-11
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