- 专利标题: Electronic device for determining failure of signal path and component, and method for operating same
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申请号: US16772511申请日: 2019-01-15
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公开(公告)号: US11258523B2公开(公告)日: 2022-02-22
- 发明人: Yoonkook Son , Yongjun An , Yuseon Lee , Hanyeop Lee , Joosung Kim , Hyoseok Na , Doil Ku , Hyunsang Kang , Juho Van , Chulseung Pyo
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Jefferson IP Law, LLP
- 优先权: KRKR10-2018-0006458 20180118
- 国际申请: PCT/KR2019/000590 WO 20190115
- 国际公布: WO2019/143100 WO 20190725
- 主分类号: H04B17/14
- IPC分类号: H04B17/14 ; H04B17/17 ; H04B17/29
摘要:
Provided are an electronic device for determining failure of a signal path and a component, and a method for operating the electronic device according to various embodiments. The electronic device comprises: at least one connection part for connection to an external device; a first signal path including an amplifier for amplifying a signal transmitted to the outside of the electronic device; a second signal path for obtaining another signal from the outside of the electronic device; an antenna port electrically connected to the first signal path and the second signal path through a filter circuit; and a communication module, wherein the communication module may be configured to transmit a transmission signal through the first signal path to the antenna port, obtain at least a part of the transmission signal through the second signal path, and determine whether the electronic device is defective on the basis of the transmission signal and information associated with at least a part of the transmission signal. Various other embodiments are possible.
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