Invention Grant
- Patent Title: Electronic device for determining failure of signal path and component, and method for operating same
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Application No.: US16772511Application Date: 2019-01-15
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Publication No.: US11258523B2Publication Date: 2022-02-22
- Inventor: Yoonkook Son , Yongjun An , Yuseon Lee , Hanyeop Lee , Joosung Kim , Hyoseok Na , Doil Ku , Hyunsang Kang , Juho Van , Chulseung Pyo
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KRKR10-2018-0006458 20180118
- International Application: PCT/KR2019/000590 WO 20190115
- International Announcement: WO2019/143100 WO 20190725
- Main IPC: H04B17/14
- IPC: H04B17/14 ; H04B17/17 ; H04B17/29

Abstract:
Provided are an electronic device for determining failure of a signal path and a component, and a method for operating the electronic device according to various embodiments. The electronic device comprises: at least one connection part for connection to an external device; a first signal path including an amplifier for amplifying a signal transmitted to the outside of the electronic device; a second signal path for obtaining another signal from the outside of the electronic device; an antenna port electrically connected to the first signal path and the second signal path through a filter circuit; and a communication module, wherein the communication module may be configured to transmit a transmission signal through the first signal path to the antenna port, obtain at least a part of the transmission signal through the second signal path, and determine whether the electronic device is defective on the basis of the transmission signal and information associated with at least a part of the transmission signal. Various other embodiments are possible.
Information query