Invention Grant
- Patent Title: Manufacturing method of semiconductor structure
-
Application No.: US16951361Application Date: 2020-11-18
-
Publication No.: US11264488B2Publication Date: 2022-03-01
- Inventor: En-Chiuan Liou , Yu-Cheng Tung
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Priority: CN201710606013 20170724
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/78 ; H01L21/8234 ; H01L21/3115 ; H01L21/8238 ; H01L27/092

Abstract:
Provided is a manufacturing method of s semiconductor structure. The method includes: providing a substrate, wherein the substrate has a plurality of fin portions and at least one recessed portion, the at least one recessed portion is located between two adjacent fin portions of the plurality of fin portions and a bottom surface of the at least one recessed portion is lower than a surface of the substrate between the two of the plurality of fin portions; forming a doping layer on a sidewall of the plurality of fin portions, the surface of the substrate, and a sidewall and a bottom portion of the at least one recessed portion; and forming a dielectric layer on the doping layer. A top surface of the doping layer and a top surface of the dielectric layer are lower than a top surface of each of the plurality of fin portions.
Public/Granted literature
- US20210074832A1 MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE Public/Granted day:2021-03-11
Information query
IPC分类: