- 专利标题: Gauge inspection jig and gauge inspector
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申请号: US16805474申请日: 2020-02-28
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公开(公告)号: US11268797B2公开(公告)日: 2022-03-08
- 发明人: Teppei Ohno , Mao Kikuchi
- 申请人: Mitutoyo Corporation
- 申请人地址: JP Kanagawa
- 专利权人: Mitutoyo Corporation
- 当前专利权人: Mitutoyo Corporation
- 当前专利权人地址: JP Kanagawa
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JPJP2019-036090 20190228
- 主分类号: G01B3/22
- IPC分类号: G01B3/22 ; G01B3/00
摘要:
A coupling portion has one end coupleable to a distal end of a measurement spindle. The measurement spindle is disposed on a gauge inspector and movable in a measurement axis direction. A cylindrical stem is insertable into a gauge holding member to hold the inserted stem. The stem slidably holds a spindle having a distal end on which a contact point of a gauge is disposed. A frame has a first end coupled to a second end of the coupling portion and has a second end to which the gauge holding member is mountable. The gauge holding member is held to the frame such that an axis of the stem runs along the measurement axis direction. As a result, inspection is performed easily and accurately in a reverse posture with a contact point facing upward when a gauge is inspected.
公开/授权文献
- US20200278188A1 GAUGE INSPECTION JIG AND GAUGE INSPECTOR 公开/授权日:2020-09-03
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