Invention Grant
- Patent Title: Dustproof test device and dustproof test method
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Application No.: US16692565Application Date: 2019-11-22
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Publication No.: US11268895B2Publication Date: 2022-03-08
- Inventor: Hong Gan , Pan Zhang , Xiaozhi Wu
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Conley Rose, P.C.
- Priority: CN201710376320.0 20170525
- Main IPC: G01N17/00
- IPC: G01N17/00 ; G01N15/06 ; G01R31/00
Abstract:
A dustproof test device includes a test box and a dust supply apparatus, where the test box includes a sample cabin, where the dust supply apparatus is connected to the test box through a dust tube, and where the dust supply apparatus is configured to transport dust into the sample cabin under the action of compressed air.
Public/Granted literature
- US20200088628A1 Dustproof Test Device and Dustproof Test Method Public/Granted day:2020-03-19
Information query
