- 专利标题: X-ray phase imaging system
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申请号: US17287412申请日: 2019-07-22
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公开(公告)号: US11268916B2公开(公告)日: 2022-03-08
- 发明人: Satoshi Sano , Koichi Tanabe , Yukihisa Wada , Satoshi Tokuda , Akira Horiba , Naoki Morimoto
- 申请人: Shimadzu Corporation
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Muir Patent Law, PLLC
- 优先权: JPJP2018-208933 20181106
- 国际申请: PCT/JP2019/028662 WO 20190722
- 国际公布: WO2020/095482 WO 20200514
- 主分类号: G01N23/041
- IPC分类号: G01N23/041 ; A61B6/02 ; G01N23/046 ; A61B6/00
摘要:
This X-ray phase imaging system (100) includes an X-ray source (1), a detector (2), a first grating group (3), a second grating group (4), a moving mechanism (5), and an image processing unit (6). The moving mechanism is configured to relatively move a subject (T) and the imaging system (9) such that the subject (T) passes through a first grating region (R1) and a second grating region (R2). The image processing unit is configured to generate a first phase-contrast image (14a) and a second phase-contrast image (14b).
公开/授权文献
- US20210364453A1 X-RAY PHASE IMAGING SYSTEM 公开/授权日:2021-11-25
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