Invention Grant
- Patent Title: Current sampling method and current sampling circuit
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Application No.: US17057433Application Date: 2019-12-04
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Publication No.: US11287454B2Publication Date: 2022-03-29
- Inventor: Yizhen Hou , Zhimin Dan , Wei Zhang , Jinbo Cai , Xiong Zheng
- Applicant: Contemporary Amperex Technology Co., Limited
- Applicant Address: CN Ningde
- Assignee: Contemporary Amperex Technology Co., Limited
- Current Assignee: Contemporary Amperex Technology Co., Limited
- Current Assignee Address: CN Ningde
- Agency: Law Offices of Liaoteng Wang
- Priority: CN201811474923.5 20181204
- International Application: PCT/CN2019/123040 WO 20191204
- International Announcement: WO2020/114426 WO 20200611
- Main IPC: G01R19/25
- IPC: G01R19/25 ; G01R19/00 ; G01R19/32

Abstract:
The present disclosure discloses a current sampling method and a current sampling circuit. The method comprises: obtaining a detected temperature of each semiconductor switch device of a plurality of parallel semiconductor switch devices; determining that the plurality of parallel semiconductor switch devices are in a current equalization state based on the detected temperature of each semiconductor switch device; obtaining an equalized current flowing through a target semiconductor switch device in the current equalization state, the target semiconductor switch device being any one of the plurality of parallel semiconductor switch devices; determining a total current of a main circuit connected to the plurality of parallel semiconductor switch devices according to the equalized current.
Public/Granted literature
- US20210293860A1 CURRENT SAMPLING METHOD AND CURRENT SAMPLING CIRCUIT Public/Granted day:2021-09-23
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