Invention Grant
- Patent Title: Inspection apparatus, inspection system, inspection method, and storage medium
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Application No.: US16752911Application Date: 2020-01-27
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Publication No.: US11293902B2Publication Date: 2022-04-05
- Inventor: Hiroaki Kuwahara
- Applicant: KABUSHIKI KAISHA TOSHIBA , TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION
- Applicant Address: JP Minato-ku; JP Kawasaki
- Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION
- Current Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION
- Current Assignee Address: JP Minato-ku; JP Kawasaki
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2019-057002 20190325
- Main IPC: G01M13/028
- IPC: G01M13/028 ; G01M7/08 ; G01N29/04

Abstract:
According to one embodiment, an inspection apparatus determines an object to be in a first state when an intensity at a first frequency of a frequency characteristic is not less than a first threshold, and determines the object to be in a second state when the intensity at the first frequency is less than the first threshold. The frequency characteristic is generated based on a vibration of the object when the object is struck. The second state is different from the first state.
Public/Granted literature
- US20200309739A1 INSPECTION APPARATUS, INSPECTION SYSTEM, INSPECTION METHOD, AND STORAGE MEDIUM Public/Granted day:2020-10-01
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