Invention Grant
- Patent Title: Product defect detection method, device and system
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Application No.: US17250262Application Date: 2020-08-29
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Publication No.: US11295435B2Publication Date: 2022-04-05
- Inventor: Jie Liu , Jifeng Tian , Wenchao Zhang , Yifan Zhang
- Applicant: GOERTEK INC.
- Applicant Address: CN Shandong
- Assignee: GOERTEK INC.
- Current Assignee: GOERTEK INC.
- Current Assignee Address: CN Shandong
- Agency: LKGlobal | Lorenz & Kopf, LLP
- Priority: CN201911401998.5 20191230
- International Application: PCT/CN2020/112313 WO 20200829
- International Announcement: WO2021/135331 WO 20210708
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/64 ; G06K9/62

Abstract:
A product defect detection method, device and system are disclosed. The method comprises: constructing a defect detection framework including segmentation networks, a concatenating network and a classification network, and setting a quantity of the segmentation network according to product defect types, wherein each segmentation network corresponds to a defect type; concatenating the sample image with the mask image output by each segmentation network by using the concatenating network to obtain a concatenated image; training the classification network by using the concatenated images to obtain a classification network capable of correctly identifying a product defect and a defect type; and when performing product defect detection, inputting a product image acquired into the defect detection framework, and detecting a product defect and a defect type existing in the product by using the segmentation networks, the concatenating network and the classification network.
Public/Granted literature
- US20210374940A1 PRODUCT DEFECT DETECTION METHOD, DEVICE AND SYSTEM Public/Granted day:2021-12-02
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