Invention Grant
- Patent Title: Measurement method and measurement apparatus
-
Application No.: US16937717Application Date: 2020-07-24
-
Publication No.: US11297523B2Publication Date: 2022-04-05
- Inventor: Hui Wen , Ning Dong , Jingjun Chen , Xiaofu Geng
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Maier & Maier, PLLC
- Priority: CN201810091241.X 20180130
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04B17/318 ; H04W76/27 ; H04W72/08

Abstract:
Embodiments of this application disclose a measurement method and a measurement apparatus, to perform RMTC measurement and DMTC measurement on an inter-frequency frequency. The method in the embodiments of this application includes: determining an idle component carrier; determining a RMTC measurement periodicity and a DMTC measurement periodicity of a first inter-frequency frequency for LAA; when the RMTC measurement periodicity and the DMTC measurement periodicity of the first inter-frequency frequency have a same time point, separately performing RMTC measurement on the first inter-frequency frequency by using the idle component carrier to obtain a first measurement result, and performing DMTC measurement on the first inter-frequency frequency to obtain a second measurement result; and sending the first measurement result and the second measurement result to a network device, where the first measurement result and the second measurement result are used to indicate the network device to schedule a resource.
Information query