- 专利标题: Memory block age detection
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申请号: US16900691申请日: 2020-06-12
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公开(公告)号: US11301343B2公开(公告)日: 2022-04-12
- 发明人: Shih-Lien Linus Lu
- 申请人: Taiwan Semiconductor Manufacturing Company Limited
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company Limited
- 当前专利权人: Taiwan Semiconductor Manufacturing Company Limited
- 当前专利权人地址: TW Hsinchu
- 代理机构: Foley & Lardner LLP
- 主分类号: G06F12/00
- IPC分类号: G06F12/00 ; G06F11/22 ; G06F11/07 ; G06F12/02 ; G06F11/30 ; G11C29/04
摘要:
Disclosed herein are related to an age detector for determining an age of a memory block, and a method of operation of the age detector. In one configuration, a memory system includes a memory block and an age detector coupled to the memory block. In one aspect, the memory block generates a first set of data in response to a first power on, and generates a second set of data in response to a second power on. In one configuration, the age detector includes a storage block to store the first set of data from the memory block, and inconsistency detector to compare the first set of data and the second set of data. In one configuration, the age detector includes a controller to determine an age of the memory block, based on the comparison.
公开/授权文献
- US20210390008A1 MEMORY BLOCK AGE DETECTION 公开/授权日:2021-12-16
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