Invention Grant
- Patent Title: Selecting metrics for system monitoring
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Application No.: US17003386Application Date: 2020-08-26
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Publication No.: US11301352B2Publication Date: 2022-04-12
- Inventor: Ling Zhuo , Yi Dai , Yin Xia , Ying Cao , Enzhong Wang
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent David K. Mattheis; Maeve M. Carpenter
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/34 ; G06F11/30

Abstract:
Ranking system metrics for monitoring by sorting members of a set of system metrics into correlation groups according to correlations among historic time series data, determining a sensitivity of the members of the set of system metrics, determining an importance of the members of the set of system metrics according to the correlation groups and sensitivity, and ranking the members of the set of system metrics according to the importance.
Public/Granted literature
- US20220066900A1 SELECTING METRICS FOR SYSTEM MONITORING Public/Granted day:2022-03-03
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