Invention Grant
- Patent Title: Supercritical drying apparatus and method of drying substrate using the same
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Application No.: US16561078Application Date: 2019-09-05
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Publication No.: US11302526B2Publication Date: 2022-04-12
- Inventor: Sangjine Park , Byung-Kwon Cho , Jihoon Jeong , Youngtak Kim , Yongsun Ko , Seulgee Jeon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Lee IP Law, P.C.
- Priority: KR10-2019-0004858 20190114
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/67

Abstract:
A supercritical drying apparatus and a method of drying a substrate, the apparatus including a drying chamber configured to receive a supercritical fluid and to dry a substrate; a chuck in the drying chamber, the chuck being configured to receive the substrate; and a particle remover in the drying chamber, the particle remover being configured to remove dry particles from the substrate by heating the substrate with radiant heat.
Public/Granted literature
- US20200227253A1 SUPERCRITICAL DRYING APPARATUS AND METHOD OF DRYING SUBSTRATE USING THE SAME Public/Granted day:2020-07-16
Information query
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