The present invention provides a nitride semiconductor device capable of forming a half-bridge circuit and suppressing changes in current collapse characteristics.
A first transistor of the present invention includes a first nitride semiconductor layer, and a first gate electrode, a first source electrode and a first drain electrode formed thereon. The second transistor includes a second nitride semiconductor layer, and a second gate electrode, a second source electrode and a second drain electrode formed thereon. The source electrode is electrically connected to a lower region of a first region on the substrate, the second source electrode is electrically connected to a lower region of a second region on the substrate, and a first insulating region is disposed between a portion corresponding to the first region on the substrate and a portion corresponding to the second region on the substrate.