- Patent Title: Method of detecting and treating endometriosis in a female subject
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Application No.: US16860792Application Date: 2020-04-28
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Publication No.: US11315660B2Publication Date: 2022-04-26
- Inventor: Hugh Taylor , Heather Bowerman
- Applicant: Dot Laboratories, Inc. , Yale University
- Applicant Address: US CA San Francisco; US CT New Haven
- Assignee: Dot Laboratories, Inc.,Yale University
- Current Assignee: Dot Laboratories, Inc.,Yale University
- Current Assignee Address: US CA San Francisco; US CT New Haven
- Agency: Wilson Sonsini Goodrich & Rosa
- Main IPC: G16B40/10
- IPC: G16B40/10 ; G16B40/00 ; C12Q1/686 ; C12Q1/6874 ; C12Q1/6883
Abstract:
Described herein are improved methods for the detection of endometriosis. Generally, the methods include, but are not limited to, applying machine learning algorithm to miRNA levels in order to detect, predict, diagnose, or monitor the presence or absence of endometriosis.
Public/Granted literature
- US20200321077A1 CLASSIFIERS FOR DETECTION OF ENDOMETRIOSIS Public/Granted day:2020-10-08
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