Invention Grant
- Patent Title: System and method for the characterization and dispersal of emissive elements
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Application No.: US16875995Application Date: 2020-05-16
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Publication No.: US11315910B2Publication Date: 2022-04-26
- Inventor: Kenji Sasaki , Kurt Ulmer , Paul J. Schuele , Jong-Jan Lee
- Applicant: eLux Inc.
- Applicant Address: US WA Vancouver
- Assignee: eLux Inc.
- Current Assignee: eLux Inc.
- Current Assignee Address: US WA Vancouver
- Agency: Law Office of Gerald Maliszewski
- Agent Gerald Maliszewski
- Main IPC: H01L25/075
- IPC: H01L25/075 ; H01L33/48 ; H01L33/38 ; H01L23/00 ; G01N21/59 ; H01L21/66

Abstract:
A method is provided for the selective harvest of microLED devices from a carrier substrate. Defect regions are predetermined that include a plurality of adjacent defective microLED devices on a carrier substrate. A solvent-resistant binding material is formed overlying the predetermined defect regions and exposed adhesive is dissolved with an adhesive dissolving solvent. Non-defective microLED devices located outside the predetermined defect regions are separated from the carrier substrate while adhesive attachment is maintained between the microLED devices inside the predetermined defect regions and the carrier substrate. Methods are also provided for the dispersal of microLED devices on an emissive display panel by initially optically measuring a suspension of microLEDs to determine suspension homogeneity and calculate the number of microLEDs per unit volume. If the number of harvested microLED devices in the suspension is known, a calculation can be made of the number of microLED devices per unit of suspension volume.
Public/Granted literature
- US20200286870A1 System and Method for the Characterization and Dispersal of Emissive Elements Public/Granted day:2020-09-10
Information query
IPC分类: