• Patent Title: Information processing device, object measurement system, object measurement method, and program storage medium
  • Application No.: US16971078
    Application Date: 2019-03-07
  • Publication No.: US11328439B2
    Publication Date: 2022-05-10
  • Inventor: Takeharu KitagawaJun Piao
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JPJP2018-043236 20180309
  • International Application: PCT/JP2019/009045 WO 20190307
  • International Announcement: WO2019/172363 WO 20190912
  • Main IPC: G06T7/60
  • IPC: G06T7/60 A01K61/95 H04N5/247
Information processing device, object measurement system, object measurement method, and program storage medium
Abstract:
An information processing device includes a detection unit and a calculation unit. The detection unit detects, as a measurement use point, a portion that is used for prescribed length measurement of the object, in each of sectioned regions, in an object image included in the photographed image, set on both sides with respect to a reference line which is set for the object image and by which the object image is sectioned. The calculation unit calculates the length of a segment, in each of the sectioned regions, between the measurement use point and the intersection point between the reference line and a perpendicular line passing through the measurement use point and being perpendicular to the reference line. Further, the calculation unit calculates a length, in the object, to be measured, by adding together the calculated lengths of the segments.
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