- 专利标题: Two-dimensional diffraction grating atomic interferometer and atomic interferometry method
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申请号: US17227023申请日: 2021-04-09
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公开(公告)号: US11328829B2公开(公告)日: 2022-05-10
- 发明人: Pierrick Cheiney , Baptiste Gouraud , David Brynle Barrett , Baptiste Battelier , Philippe Bouyer
- 申请人: IXBLUE
- 申请人地址: FR Saint-Germain-en-Laye
- 专利权人: IXBLUE
- 当前专利权人: IXBLUE
- 当前专利权人地址: FR Saint-Germain-en-Laye
- 代理机构: Nixon & Vanderhye
- 优先权: FR2003648 20200410
- 主分类号: G21K1/00
- IPC分类号: G21K1/00 ; G01P15/093 ; G02B5/18 ; G02B27/28
摘要:
Disclosed is an atomic interferometer including a source of atoms, a laser source and a magnetic field generating device, a polarizer, a system for adjusting a detuning between two optical frequencies of the incident laser beam, a two-dimensional diffraction grating arranged in such a way as to receive the incident laser beam and to form by diffraction at least three diffracted beams, a controller configured to select a combination of an optical frequency detuning, a polarization state and a magnetic field, the combination being adapted to select a first pair of laser beams among the pairs of beams formed from the incident laser beam and the diffracted beams, the pair of laser beams being applied in such a way as to interact with the cloud of atoms by multi-photon transitions and to detect an acceleration of the cloud of atoms along a measurement direction.
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