Invention Grant
- Patent Title: Image recognition system, method, and program, and parameter-training system, method, and program
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Application No.: US16955605Application Date: 2017-12-22
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Publication No.: US11334772B2Publication Date: 2022-05-17
- Inventor: Takahiro Toizumi , Yuzo Senda
- Applicant: NEC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2017/046162 WO 20171222
- International Announcement: WO2019/123642 WO 20190627
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06V10/44

Abstract:
A label feature extraction means 71 extracts, from reference information, a label feature that is a vector representing a feature of the reference information. A label feature dimension reduction means 72 performs dimension reduction of the label feature. An image feature extraction means 73 extracts an image feature from a target image that is an image in which an object to be recognized is captured. A feature transformation means 74 performs feature transformation on the image feature in such a manner that comparison with the label feature after the dimension reduction becomes possible. The class recognition means 75 recognizes a class of the object to be recognized by comparing the image feature after the feature transformation with the label feature after the dimension reduction.
Public/Granted literature
- US20210056343A1 IMAGE RECOGNITION SYSTEM, METHOD, AND PROGRAM, AND PARAMETER-TRAINING SYSTEM, METHOD, AND PROGRAM Public/Granted day:2021-02-25
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