Invention Grant
- Patent Title: Calibration method of x-ray measuring device
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Application No.: US17014308Application Date: 2020-09-08
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Publication No.: US11346660B2Publication Date: 2022-05-31
- Inventor: Masato Kon , Hiromu Maie , Seiji Sasaki , Jyota Miyakura
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2019-163979 20190909
- Main IPC: G01B15/04
- IPC: G01B15/04

Abstract:
A calibration method of an X-ray measuring device includes: a front-stage feature position calculation step of parallelly moving spheres disposed in N places a plurality of times, and identifying centroid positions ImPos(1 to Q)_Dis(1 to M)_Sphr_(1 to N) of projected images of the spheres in the N places; an individual matrix calculation step of calculating an individual projection matrix PPj (j=1 to Q) for each of the spheres; an individual position calculation step of calculating moving positions Xb of the spheres on the basis of the individual projection matrix PPj (j=1 to Q); a coordinate integration step of calculating specific relative position intervals X(1 to N) of the spheres; a rear-stage feature position calculation step; a transformation matrix calculation step of calculating a projective transformation matrix Hk (k=1 to Q); a rotation detection step; a position calculation step; and a center position calculation step.
Public/Granted literature
- US20210072022A1 CALIBRATION METHOD OF X-RAY MEASURING DEVICE Public/Granted day:2021-03-11
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