Invention Grant
- Patent Title: Contact probe and probe unit
-
Application No.: US16496608Application Date: 2018-03-29
-
Publication No.: US11346859B2Publication Date: 2022-05-31
- Inventor: Kazuya Souma , Tsukasa Sakaguchi
- Applicant: NHK Spring Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Locke Lord LLP
- Priority: JPJP2017-069272 20170330
- International Application: PCT/JP2018/013367 WO 20180329
- International Announcement: WO2018/181776 WO 20181004
- Main IPC: G01R1/067
- IPC: G01R1/067

Abstract:
A contact probe is conductive and capable of expanding/contracting along an axial line direction. The contact probe includes: a first contact member configured to contact one contact target; a second contact member configured to contact another contact target, and to house at least a portion of the first contact member; and a spring member configured to couple the first contact member and the second contact member in a manner capable of expansion/contraction with both end parts of the spring member. The spring member is wound in a helical shape, and at least a diameter of an outer circumference in one of the end parts held by the second contact member is larger than diameters of other portions. A diameter of an inner circumference of an end part of the second contact member on a side housing the first contact member is equal to or larger than a maximum diameter of the first contact member.
Public/Granted literature
- US20210223287A1 CONTACT PROBE AND PROBE UNIT Public/Granted day:2021-07-22
Information query